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  • 姓名： 孫澤宇
  • 性別： 男
  • 職稱： 研究員
  • 職務： 研究員
  • 學歷： 博士
  • 電話： 
  • 傳真： 
  • 電子郵件： sunzeyu@ime.ac.cn
  • 所屬部門： EDA中心
  • 通訊地址： 北京市朝陽區(qū)北土城西路3號

    簡　　歷：

  • 教育背景

    2015-09 至 2020-03, 美國加州大學河濱分校, 電子及計算機工程, 博士

    2011-09 至 2015-06, 香港科技大學, 電子及計算機工程, 學士

    工作簡歷

    ?2024.12-?至今, 中國科學院微電子研究所, EDA中心, 研究員

    ?2024-03 至 2024-12, 中國科學院微電子研究所, EDA中心, 副研究員

    ?2020-04 至 2024-03, 美國鏗騰電子（Cadence Design Systems）, 首席工程師



    社會任職：

    研究方向：

  • 人工智能EDA，集成電路可靠性


    承擔科研項目情況：

  • 國家級海外青年人才項目，項目負責人，2025.01–2027.12


    代表論著：

  • Sun, Zeyu;?Tong, Weijie; Ma, Xiaoning; Cao, He; Liu, Jianyun; Li, Zhiqiang; Xu, Qinzhi;

    ChipletEM: Physics-Based 2.5D and 3D Chiplet Heterogeneous Integration Electromigration Signoff Tool Using Coupled Stress and Thermal Simulation, Design Automaiton Conference, San Fransico US, 2025-06-23至2025-06-26

    ?Zeyu Sun;?Shuyuan Yu; Han Zhou; Yibo Liu; Sheldon X.-D.Tan; EMSpice: Physics-Based

    Electromigration Check Using Coupled Electronic and Stress Simulation, IEEE Transactions on ?Device and Materials Reliability, 2020, 20(2): 376-389

    ?Zeyu Sun; Sheriff Sadiqbatcha; Hengyang Zhao; Sheldon X.-D. Tan; Saturation-Volume

    Estimation for Multisegment Copper Interconnect Wires, IEEE Transactions on Very Large Scale

    Integration (VLSI) Systems, 2019, 27(7): 1666-1674

    ?Zeyu Sun;?Ertugrul Demircan; Mehul D. Shroff; Chase Cook; Sheldon X.-D. Tan; Fast

    Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires, IEEE

    Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018, 37(12): 3137-3150

    ?Zeyu Sun;?Sheriff Sadiqbatcha; Hengyang Zhao; Sheldon X.-D.Tan ; Accelerating

    electromigration aging for fast failure detection for nanometer ICs, 2018 23rd Asia and South

    Pac

    Zeyu Sun; Ertugrul Demircan; Mehul D.Shrof; Taeyoung Kim; Xin Huang; Sheldon X.-D.Tan ;

    Voltage-based electromigration immortality check for general multi-branch interconnects,

    Proceedings of the 35th International Conference on Computer-Aided Design, Austin, TX, USA

    ?Zeyu Sun;?Han Zhou; Sheldon X.-D. Tan ; Dynamic Reliability Management for Multi-Core

    Processor Based on Deep Reinforcement Learning, 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lausanne, Switzerland

    ?Zeyu Sun;?Taeyoung Kim; Marcus Chow; Shaoyi Peng; Han Zhou; Hyoseung Kim; Daniel Wong;

    Sheldon X.-D.Tan ; Long-Term Reliability Management For Multitasking GPGPUs, 2019 16th

    International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lausanne, Switzerland,

    ?

    專著：

    ?Sheldon Tan; Mehdi Tahoori; Taeyoung Kim; Shengcheng Wang; Zeyu Sun;?Saman Kiamehr; Long Term Reliability of Nanometer VLSI Systems, Springer Nature Switzerland AG, 2019 (學術專著)?




    專利申請：

  • 埋入式電源軌的電遷移應力建模方法和裝置, 2025-12-22, 中國, 2025119370348?


    獲獎及榮譽：

  • 國家海外高層次人才引進計劃入選者